DESIGN CRITERIA AND SENSITIVITY CALCULATIONS FOR MULTIELEMENTAL TRACE ANALYSIS AT THE NSLS X-RAY MICROPROBE

被引：42

作者：

GORDON, BM

JONES, KW

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1985年 / 10-1卷 / MAY期

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D O I：

10.1016/0168-583X(85)90255-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

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页码：293 / 298

页数：6

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