NEAR-FIELD OPTOELECTRONIC DETECTOR PROBES BASED ON STANDARD SCANNING FORCE CANTILEVERS

被引：19

作者：

DANZEBRINK, HU ^{[1
]}

WILKENING, G ^{[1
]}

OHLSON, O ^{[1
]}

机构：

[1] NANOSENSORS DR OLAF WOLTER GMBH,D-71134 AIDLINGEN,GERMANY

来源：

APPLIED PHYSICS LETTERS | 1995年 / 67卷 / 14期

关键词：

D O I：

10.1063/1.114760

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Near-field probes have been developed, based on standard, i.e., commercially available, Si cantilever probes for scanning force microscopy (SFM), which directly convert the optical near-field signal into an electrical signal using Schottky contacts. With these optoelectronic probes it is possible to realize very compact near-field microscopes. The probes are inserted into a SFM and measure the topography and the optical near-field signal simultaneously. The qualitative analysis of the light-sensitive areas of the probes and the detection of the optical near field is described. Finally, subwavelength resolution is demonstrated when a polished glass surface is investigated. (C) 1995 American Institute of Physics.

引用

页码：1981 / 1983

页数：3

共 10 条

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