THE ACTIVE-INPUT REGULATED-CASCODE CURRENT MIRROR

被引：57

作者：

SERRANO, T

LINARES-BARRANCO, B

机构：

[1] National Microelectronics Center (CNM), Department of Analog Circuits Design, Ed. CICA, 41012, Sevilla

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | 1994年 / 41卷 / 06期

关键词：

D O I：

10.1109/81.295247

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A continuous-time current mirror circuit is presented that combines an active input and a regulated cascode output. The current mirror offers a high accuracy over an operating current range higher than previous structures. Results are demonstrated through Hspice nominal and Monte Carlo simulations.

引用

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页码：464 / 467

页数：4

相关论文

共 8 条

[1] ADAPTIVE BIASING CMOS AMPLIFIERS [J].

DEGRAUWE, MG ;

RIJMENANTS, J ;

VITTOZ, EA ;

DEMAN, HJ .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1982, 17 (03) :522-528

[2] ANALOG CMOS REALIZATION OF FUZZY-LOGIC MEMBERSHIP FUNCTIONS [J].

KETTNER, T ;

HEITE, C ;

SCHUMACHER, K .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1993, 28 (07) :857-861

[3] CMOS CONTINUOUS-TIME CURRENT-MODE FILTERS FOR HIGH-FREQUENCY APPLICATIONS [J].

LEE, SS ;

ZELE, RH ;

ALLSTOT, DJ ;

LIANG, GJ .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1993, 28 (03) :323-329

[4]

MEDEIRO F, 1994, IN PRESS ANALOG INTE

[5] CURRENT-MODE ALGORITHMIC ANALOG-TO-DIGITAL CONVERTERS [J].

NAIRN, DG ;

SALAMA, CAT .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (04) :997-1004

[6] MATCHING PROPERTIES OF MOS-TRANSISTORS [J].

PELGROM, MJM ;

DUINMAIJER, ACJ ;

WELBERS, APG .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1989, 24 (05) :1433-1440

[7] CURRENT-MODE TECHNIQUES FOR THE IMPLEMENTATION OF CONTINUOUS-TIME AND DISCRETE-TIME CELLULAR NEURAL NETWORKS [J].

RODRIGUEZVAZQUEZ, A ;

ESPEJO, S ;

DOMINGUEZCASTRO, R ;

HUERTAS, JL ;

SANCHEZSINENCIO, E .

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING, 1993, 40 (03) :132-146

[8] A HIGH-SWING, HIGH-IMPEDANCE MOS CASCODE CIRCUIT [J].

SACKINGER, E ;

GUGGENBUHL, W .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (01) :289-298