CHARGE-DENSITY WAVES AND STRAIN WAVES IN THIN EPITAXIAL CR(001) FILMS ON NB

被引：24

作者：

SONNTAG, P ^{[1
]}

BODEKER, P ^{[1
]}

THURSTON, T ^{[1
]}

ZABEL, H ^{[1
]}

机构：

[1] BROOKHAVEN NATL LAB,UPTON,NY 11973

来源：

PHYSICAL REVIEW B | 1995年 / 52卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.52.7363

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have investigated the magnetic structure of thin epitaxial (001)-oriented Cr films grown on a Nb buffer layer on sapphire. By means of x-ray diffraction measurements the charge density waves (CDW) and strain waves (SW) in Cr films with thicknesses between 500 and 3000 Angstrom have been studied. The results show that there exists an orientational pinning effect at both the Cr surface and the interface between Cr and the Nb buffer layer which causes an enlargement of the CDW-SW period, and a single a domain mode having a q vector pointing perpendicular to the surface. This pinning behavior relaxes with increasing film thickness.

引用

页码：7363 / 7368

页数：6

共 28 条

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ANKNER JF, 1990, THESIS U ILLINOIS UR

[2] A NEUTRON-DIFFRACTION STUDY OF VERY PURE CHROMIUM [J].