THIN-FILMS OF RARE-EARTH-METAL SILICIDES IN MICROELECTRONICS

[1] Gershinskii A. E., 1982, MIKROELEKTRONIKA, V11, P83

[2] KACHURINA EE, 1982, PRIBORY, V6

[3] KOLESHKO VM, 1985, 2ND SEM SCI MAT RES, P70

[4] KOLESHKO VM, 1979, FIZ TECHN POLUPROVOD, V13, P1890

[5] THE SCHOTTKY-BARRIER HEIGHT OF THE CONTACTS BETWEEN SOME RARE-EARTH-METALS (AND SILICIDES) AND P-TYPE SILICON [J]. APPLIED PHYSICS LETTERS, 1981, 38 (11) : 865 - 867

[6] SILICIDE SILICON INTERFACE BONDING [J]. ULTRAMICROSCOPY, 1984, 14 (1-2) : 107 - 119

[7] SAMSONOV GV, 1979, SILITSIDY METALLURGI

[8] ZUR A, 1985, J APPL PHYS, V57, P600, DOI 10.1063/1.334743

[1] Gershinskii A. E., 1982, MIKROELEKTRONIKA, V11, P83

[2] KACHURINA EE, 1982, PRIBORY, V6

[3] KOLESHKO VM, 1985, 2ND SEM SCI MAT RES, P70

[4] KOLESHKO VM, 1979, FIZ TECHN POLUPROVOD, V13, P1890

[5] THE SCHOTTKY-BARRIER HEIGHT OF THE CONTACTS BETWEEN SOME RARE-EARTH-METALS (AND SILICIDES) AND P-TYPE SILICON [J]. APPLIED PHYSICS LETTERS, 1981, 38 (11) : 865 - 867

[6] SILICIDE SILICON INTERFACE BONDING [J]. ULTRAMICROSCOPY, 1984, 14 (1-2) : 107 - 119

[7] SAMSONOV GV, 1979, SILITSIDY METALLURGI

[8] ZUR A, 1985, J APPL PHYS, V57, P600, DOI 10.1063/1.334743