共 9 条
- [1] INFRARED-SPECTROSCOPY OF OXIDE LAYERS ON TECHNICAL SI WAFERS [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1986, 39 (04): : 257 - 268
- [2] OPTICAL-PROPERTIES OF THIN-FILMS AND THE BERREMAN EFFECT [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 38 (04): : 263 - 267
- [3] COHERENT AND INCOHERENT REFLECTION AND TRANSMISSION OF MULTILAYER STRUCTURES [J]. APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1986, 39 (03): : 165 - 170
- [4] HARRICK NJ, 1967, INTERNAL REFLECTION, P138
- [5] LANDFORD WA, 1978, J APPL PHYS, V49, P2473
- [6] MACLEOD HA, 1986, THIN FILM OPTICAL FI, P40
- [8] Palik E. D., 1985, HDB OPTICAL CONSTANT, P394
- [9] [No title captured]