ION NEUTRALIZATION IN SECONDARY ION MASS-SPECTROMETRY

被引：27

作者：

GARRETT, RF

MACDONALD, RJ

OCONNOR, DJ

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91002-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：333 / 335

页数：3

共 10 条

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[3]

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[6] NEUTRALIZATION OF HE+ AND NE+ SCATTERED FROM AG [J].

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[7] EMPIRICAL RELATIONSHIP BETWEEN ATOMS AND IONS SPUTTERED FROM SINGLE-CRYSTAL SURFACES [J].

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[8] SECONDARY-ION EMISSION PROBABILITY IN SPUTTERING [J].

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[9]

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[10] EVIDENCE FOR THE AUGER NEUTRALIZATION MECHANISM IN SECONDARY ION EMISSION [J].

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SURFACE SCIENCE, 1982, 115 (03) :L141-L146

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