AUGER RECOMBINATION AND JUNCTION RESISTANCE IN LEAD-TIN TELLURIDE

被引：109

作者：

EMTAGE, PR ^{[1
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机构：

[1] WESTINGHOUSE RES LABS,PITTSBURGH,PA 15235

来源：

关键词：

D O I：

10.1063/1.322975

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2565 / 2568

页数：4

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