ANALYTIC AND EXPERIMENTAL TECHNIQUES FOR EVALUATING TRANSIENT THERMAL CHARACTERISTICS OF TRAPATT DIODES

被引：5

作者：

BOWEN, JH

BREESE, ME

MIKENAS, VA

WEISS, M

LIU, S

SOBOL, H

机构：

[1] RCA LABS,MISSILE & SURFACE RADAR DIV,MOORESTOWN,NJ 08057

[2] RCA LABS,DAVID SARNOFF RES CTR,PRINCETON,NJ 08540

来源：

关键词：

D O I：

10.1109/T-ED.1974.17953

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：480 / 487

页数：8

共 8 条

[1] CARSLAW HS, 1959, CONDUCTION HEAT SOLI
[2] CHATURVEDI PK, 1973, IEEE T ELECTRON DEVI, VED20, P353
[3] CRANDELL MJ, 1971, MICROWAVES, P50
[4] KELLEY KK, 476 BUR MIN B
[5] JUNCTION-TEMPERATURE MEASUREMENT OF IMPATT DIODES
KENYON, ND
DALESSIO, FJ
[J]. ELECTRONICS LETTERS, 1972, 8 (05) : 118 - &
[6] MCAVOY BR, 1971, IEEE T ELECTRON DEVI, VED18, P973
[7] DOUBLE PULSE MEASUREMENTS OF AVALANCHING P-N-JUNCTION SUBMICROSECOND TRANSIENT THERMAL RESPONSE
NIGRIN, J
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (02) : 264 - +
[8] RUNGAN WR, TI ELECTRONIC SERIES, pCH10