INFLUENCE OF EXTENDED DEFECTS AND NATIVE IMPURITIES ON THE ELECTRICAL-PROPERTIES OF DIRECTIONALLY SOLIDIFIED POLYCRYSTALLINE SILICON

[41] Tice W. K., 1981, Defects in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P367

[42] VARKER CJ, 1983, DEFECTS SEMICONDUCTO, V2, P187

[43] WATANABE M, 1981, ELECTROCHEMICAL SOC, P126

[44] ZEHAF M, 1985, THESIS U AIX MARSEIL

[45] ZULENHER W, 1982, CRYSTALS, V8, P154

[46] [No title captured]

[41] Tice W. K., 1981, Defects in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P367

[42] VARKER CJ, 1983, DEFECTS SEMICONDUCTO, V2, P187

[43] WATANABE M, 1981, ELECTROCHEMICAL SOC, P126

[44] ZEHAF M, 1985, THESIS U AIX MARSEIL

[45] ZULENHER W, 1982, CRYSTALS, V8, P154

[46] [No title captured]