THE BOUND-STATE RESONANT TUNNELING TRANSISTOR (BSRTT) - FABRICATION, DC IV CHARACTERISTICS AND HIGH-FREQUENCY PROPERTIES

被引:14
作者
HADDAD, GI
REDDY, UK
SUN, JP
MAINS, RK
机构
[1] Center for High-Frequency Microelectronics Department of Electrical Engineering, Computer Science The University of Michigan, Ann Arbor
关键词
D O I
10.1016/0749-6036(90)90228-Y
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The output characteristics of resonant tunneling transistors with a charge filled bound state quantum well base obtained by a self-consistent solution of Poisson's and Schrödinger's equations show the effect of coupling between the input and output ports of the device and the effect on the current-voltage characteristics. Using a self-aligned process transistors were fabricated which showed a current gain of 3 and transconductances of 30 mS. The output characteristics do not saturate and this is in qualitative agreement with theoretical predictions. The charge and potential distributions obtained from the self-consistent calculations are used in a quasi-static analysis of the small signal parameters for a hybrid-π model, and the high-frequency performance of the transistor is analyzed. © 1990.
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页码:369 / 374
页数:6
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