SPECTROSCOPIC ELECTROREFLECTANCE AND ELLIPSOMETRY OF INGAASP INP AND GAALAS-GAAS GAAS HETEROSTRUCTURES

被引：9

作者：

ALIBERT, C ^{[1
]}

HUA, FJ ^{[1
]}

ERMAN, M ^{[1
]}

FRIJLINK, P ^{[1
]}

JARRY, P ^{[1
]}

THEETEN, JB ^{[1
]}

机构：

[1] LABS ELECTR & PHYS APPL,ELECTRON & PHYS APPL LAB,F-94450 LIMEIL BREVANNES,FRANCE

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1983年 / 18卷 / 11期

关键词：

D O I：

10.1051/rphysap:019830018011070900

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：709 / 717

页数：9

共 21 条

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