UNCERTAINTIES IN THICK-TARGET PIXE ANALYSIS

被引：52

作者：

CAMPBELL, JL ^{[1
]}

COOKSON, JA ^{[1
]}

PAUL, H ^{[1
]}

机构：

[1] JOHANNES KEPLER UNIV,INST EXPTL PHYS,A-4040 LINZ,AUSTRIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 212卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)90725-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：427 / 439

页数：13

共 32 条

[1] ANDERSEN HH, 1977, STOPPING POWER RANGE, V2
[2] ANDERSEN HH, 1977, STOPPING POWER RANGE, V3
[3] [Anonymous], ELECT MICROPROBE
[4] X-RAY ANALYSIS OF THICK TARGETS WITH ALPHA-PARTICLES
BAUER, KG
FAZLY, Q
MAYERKUCKUK, T
MOMMSEN, H
SCHURKES, P
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 148 (02): : 407 - 413
[5] Benka O., 1978, Atomic Data and Nuclear Data Tables, V22, P219, DOI 10.1016/0092-640X(78)90015-3
[6] ENERGY-LOSS EFFECT IN INNER-SHELL COULOMB IONIZATION BY HEAVY CHARGED-PARTICLES
BRANDT, W
LAPICKI, G
[J]. PHYSICAL REVIEW A, 1981, 23 (04): : 1717 - 1729
[7] THICK TARGET PIXE ANALYSIS AND YIELD CURVE CALCULATIONS
CLAYTON, E
COHEN, DD
DUERDEN, P
[J]. NUCLEAR INSTRUMENTS & METHODS, 1981, 180 (2-3): : 541 - 548
[8] UNCERTAINTIES IN THEORETICAL THICK TARGET PIXE YIELDS
CLAYTON, E
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3): : 567 - 572
[9] PROTON-INDUCED X-RAY-EMISSION (PIXE) ANALYSIS ON THICK SAMPLES EXEMPLIFIED ON THE RARE-EARTH ELEMENTS .1. EXPERIMENTAL-DETERMINATION OF CALIBRATION CURVES, PRECISION, AND MATRIX EFFECTS
GARTEN, RPH
GROENEVELD, KO
KONIG, KH
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1981, 307 (02): : 97 - 104
[10] A SEMI-EMPIRICAL PROCEDURE FOR THE SIMPLE CALCULATION OF THE SIGNAL INTENSITY IN PIXE ANALYSIS OF THICK SAMPLES
GARTEN, RPH
GROENEVELD, KO
KONIG, KH
[J]. NUCLEAR INSTRUMENTS & METHODS, 1981, 181 (1-3): : 185 - 188