AN EELS AND XAS STUDY OF CUBIC BORON-NITRIDE SYNTHESIZED UNDER HIGH-PRESSURE - HIGH-TEMPERATURE CONDITIONS

被引:37
作者
JAOUEN, M
HUG, G
GONNET, V
DEMAZEAU, G
TOURILLON, G
机构
[1] OFF NATL ETUD & RECH AEROSP,ETUD MICROSTRUCT LAB,CNRS,F-92322 CHATILLON,FRANCE
[2] CNRS,UPR 8661,CHIM SOLIDE LAB,F-33405 TALENCE,FRANCE
[3] CTR UNIV PARIS SUD,MEN,CEA,UTILISAT RAYONNEMENT ELECTROMAGENT LAB,CNRS,F-91405 ORSAY,FRANCE
来源
MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1995年 / 6卷 / 01期
关键词
D O I
10.1051/mmm:1995113
中图分类号
TH742 [显微镜];
学科分类号
摘要
Cubic Boron Nitride (c-BN) single-crystals have been synthesized under high pressure and high temperature conditions (HP - HT) using hexagonal Boron Nitride (h-BN) precursors. We have performed a study of both phases with electron (EELS) and X-ray (XAS) spectroscopy that are compared. The c-BN ELNES spectra at B-K and N-K edges are found to be consistent with the XANES (XAS) data, although the energy resolution achieved with X-rays is better than that obtained by EELS with a LaB6 filament. However, XAS is at a disadvantage by comparison with EELS owing to the presence of the N-K edge second order. Attempts were made to dope c-BN with carbon atoms. The examination of the EELS spectra reveals that the incorporation of carbon species in the BN material is always accompanied by the addition of oxygen. Several samples were analyzed both with selected area electron diffraction and energy loss spectroscopy. Most probed crystals containing C (and therefore O) were found to be hexagonal. These results emphasized that the range of existence of the cubic phase is very narrow around the binary composition.
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页码:127 / 139
页数:13
相关论文
共 23 条
[1]  
[Anonymous], 1992, NEXAFS SPECTROSCOPY, DOI DOI 10.1007/978-3-662-02853-7
[2]  
BASTON PE, 1992, EMPMD MONOGRAPH SERI, P217
[3]   SIMULTANEOUS STEM IMAGING AND ELECTRON-ENERGY-LOSS SPECTROSCOPY WITH ATOMIC-COLUMN SENSITIVITY [J].
BATSON, PE .
NATURE, 1993, 366 (6457) :727-728
[4]   DYNAMIC SCREENING OF THE CORE EXCITON BY SWIFT ELECTRONS IN ELECTRON-ENERGY-LOSS SCATTERING [J].
BATSON, PE ;
BRULEY, J .
PHYSICAL REVIEW LETTERS, 1991, 67 (03) :350-353
[5]   CHARACTERIZATION OF CHEMICAL BONDING AND PHYSICAL CHARACTERISTICS OF DIAMOND-LIKE AMORPHOUS-CARBON AND DIAMOND FILMS [J].
BHUSHAN, B ;
KELLOCK, AJ ;
CHO, NH ;
AGER, JW .
JOURNAL OF MATERIALS RESEARCH, 1992, 7 (02) :404-410
[6]   COMPARISON OF THE TI K EXTENDED FINE-STRUCTURE OBTAINED FROM ELECTRON-ENERGY-LOSS SPECTROSCOPY AND X-RAY-ABSORPTION SPECTROSCOPY [J].
BLANCHE, G ;
HUG, G ;
JOUEN, M ;
FLANK, AM .
ULTRAMICROSCOPY, 1993, 50 (02) :141-145
[7]  
BOZZOLO N, 1994, EDITIONS PHYS A, V2, P577
[8]   ELECTRON-MICROSCOPY - THE ULTIMATE ANALYSIS [J].
BROWN, LM .
NATURE, 1993, 366 (6457) :721-721
[9]   ELECTRON-ENERGY LOSS SPECTRA OF DIAMOND, GRAPHITE AND AMORPHOUS CARBON [J].
EGERTON, RF ;
WHELAN, MJ .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (03) :232-236
[10]  
EGERTON RF, 1989, ELECTRON ENERGY LOSS