DEVELOPMENT OF STEPS ON GAAS DURING MOLECULAR-BEAM EPITAXY

被引:34
作者
VANHOVE, JM
COHEN, PI
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1982年 / 20卷 / 03期
关键词
D O I
10.1116/1.571439
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:726 / 729
页数:4
相关论文
共 15 条
[1]   SURFACE STOICHIOMETRY AND STRUCTURE OF GAAS [J].
ARTHUR, JR .
SURFACE SCIENCE, 1974, 43 (02) :449-461
[2]   SEMICONDUCTOR SURFACE AND CRYSTAL PHYSICS STUDIED BY MBE [J].
BACHRACH, RZ .
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1979, 2 (1-2) :115-144
[3]  
Bauer E., 1969, TECHNIQUES DIRECT OB, VII, P501
[4]   THEORY OF RHEED FOR GENERAL SURFACES [J].
BEEBY, JL .
SURFACE SCIENCE, 1979, 80 (01) :56-61
[5]  
BLAKELY JM, 1973, INTRO PROPERTIES CRY, P103
[7]   ELECTROLYTIC DECOMPOSITION AND PHOTO-DECOMPOSITION OF COMPOUND SEMICONDUCTORS IN CONTACT WITH ELECTROLYTES [J].
GERISCHER, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (04) :1422-1428
[8]  
Henzler M., 1977, Electron spectroscopy for surface analysis, P117
[9]   CALCULATIONS OF RHEED SCATTERING INTENSITIES [J].
HOLLOWAY, S .
SURFACE SCIENCE, 1979, 80 (01) :62-68
[10]   ORIGINS OF STREAKED INTENSITY DISTRIBUTIONS IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION [J].
HOLLOWAY, S ;
BEEBY, JL .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (07) :L247-L251