SEMICONDUCTOR SURFACE AND CRYSTAL PHYSICS STUDIED BY MBE

被引:15
作者
BACHRACH, RZ
机构
[1] XEROX PARC, Palo Alto, CA 94304
来源
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1979年 / 2卷 / 1-2期
关键词
D O I
10.1016/0146-3535(81)90027-7
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
A review is presented of semiconductor surface and crystal physics studies carried out with the use of molecular beam epitaxial growth techniques. The studies reviewed are related to an understanding of the various aspects of the growth process. Examples are drawn from a variety of semiconductors, but special emphasis is given to GaAs related results. © 1981.
引用
收藏
页码:115 / 144
页数:30
相关论文
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