COMPARISON OF PHOTOGRAPHIC AND PHOTOELECTRIC MEASUREMENT OF RADIATION IN THE DETERMINATION OF SMALL CONCENTRATIONS IN EMISSION-SPECTROMETRY

被引：8

作者：

HAISCH, U

LAQUA, K

HAGENAH, WD

WAECHTER, H

机构：

[1] INST SPEKTROCHEM & ANGEW SPEKT,D-4600 DORTMUND 1,FED REP GER

[2] FACH HSCH TECH MANNHEIM,D-6800 MANNHEIM,FED REP GER

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1983年 / 316卷 / 02期

关键词：

D O I：

10.1007/BF00488181

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：157 / 169

页数：13

共 25 条

[1]

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[2]

FRIESER H, 1935, KINOTEKHNIKA, V17, P167

[3] EFFECT OF PHOTOMETRIC ERROR ON ANALYTIC PRECISION IN SPECTROGRAPHY [J].

GERBATSCH, R ;

SCHOLZE, H .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1970, B 25 (02) :101-+

[4] DETERMINATION OF SMALLEST CONCENTRATIONS OF CHEMICAL ELEMENTS IN EMISSION SPECTRUM ANALYSIS WITH PHOTOELECTRIC RADIATION MEASUREMENT .1. INFLUENCE OF LINEAR PROFILE ON ANALYTICAL CALIBRATION CURVE AND LIMITATIONS OF DETECTION [J].

HAISCH, U .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1970, B 25 (11) :597-&

[5] TRACE DETERMINATIONS IN EMISSION SPECTROCHEMICAL ANALYSIS [J].

HAISCH, U .

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1972, 259 (01) :1-&

[6] DETERMINATION OF SMALLEST CONCENTRATIONS OF CHEMICAL ELEMENTS IN EMISSION SPECTRUM ANALYSIS WITH PHOTOELECTRIC IRRADIATION MEASUREMENT .2. TRACE DETERMINATION WITH EXIT SLIT SYSTEM FROM PHOTOCONDUCTORS [J].

HAISCH, U ;

LAQUA, K ;

HAGENAH, WD .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1971, B 26 (10) :651-&

[7]

HANSEN G, 1946, OPTIK, V1, P227

[8]

HANSEN G, 1950, OPTIK, V6, P387

[9]

HANSEN G, 1947, OPTIK, V2, P151

[10]

HONERJAGERSOHM M, 1944, SPECTROCHIM ACTA, V2, P396

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