WAVE-VECTOR IMAGING PHOTOELECTRON SPECTROMETER

被引：5

作者：

CLARKE, A

JENNINGS, G

WILLIS, RF

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1987年 / 58卷 / 08期

关键词：

D O I：

10.1063/1.1139429

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1439 / 1444

页数：6

共 13 条

[1]

BERGER C, 1977, J APPL PHYS, V48, P12

[2] AN ELLIPSOIDAL MIRROR DISPLAY ANALYZER SYSTEM FOR ELECTRON-ENERGY AND ANGULAR MEASUREMENTS [J].

EASTMAN, DE ;

DONELON, JJ ;

HIEN, NC ;

HIMPSEL, FJ .

NUCLEAR INSTRUMENTS & METHODS, 1980, 172 (1-2) :327-336

[3] SELF-CONSISTENT RELATIVISTIC BAND-STRUCTURE OF THE NOBLE-METALS [J].

ECKARDT, H ;

FRITSCHE, L ;

NOFFKE, J .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1984, 14 (01) :97-112

[4] NOVEL CHARGED-PARTICLE ANALYZER FOR MOMENTUM DETERMINATION IN THE MULTI-CHANNELING MODE .1. DESIGN ASPECTS AND ELECTRON-ION OPTICAL-PROPERTIES [J].

ENGELHARDT, HA ;

BACK, W ;

MENZEL, D ;

LIEBL, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (06) :835-839

[5] NOVEL CHARGED-PARTICLE ANALYZER FOR MOMENTUM DETERMINATION IN THE MULTICHANNELING MODE .2. PHYSICAL REALIZATION, PERFORMANCE TESTS, AND SAMPLE SPECTRA [J].

ENGELHARDT, HA ;

ZARTNER, A ;

MENZEL, D .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (08) :1161-1173

[6] A MIRROR ELECTRON-MICROSCOPE FOR SURFACE-ANALYSIS [J].

FOSTER, MS ;

CAMPUZANO, JC ;

WILLIS, RF ;

DUPUY, JC .

JOURNAL OF MICROSCOPY-OXFORD, 1985, 140 :395-403

[7]

GRIVET P, 1965, ELECTRON OPTICS, P183

[8]

HUFNER S, COMMUNICATION

[9]

Johannson H, 1933, ANN PHYS-BERLIN, V18, P385

[10] HIGH-RESOLUTION ANGLE-RESOLVED-PHOTOEMISSION STUDIES OF THE M-BAR-POINT SURFACE-STATE ON CU(001) [J].

KEVAN, SD ;

SHIRLEY, DA .

PHYSICAL REVIEW B, 1980, 22 (02) :542-548

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