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MEASUREMENT OF BASE RESISTANCE OF BIPOLAR-TRANSISTORS
被引:4
作者
:
MEIJER, GCM
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,DEPT ELECT ENGN,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,DEPT ELECT ENGN,DELFT,NETHERLANDS
MEIJER, GCM
[
1
]
DERONDE, HJA
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,DEPT ELECT ENGN,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,DEPT ELECT ENGN,DELFT,NETHERLANDS
DERONDE, HJA
[
1
]
机构
:
[1]
DELFT UNIV TECHNOL,DEPT ELECT ENGN,DELFT,NETHERLANDS
来源
:
ELECTRONICS LETTERS
|
1975年
/ 11卷
/ 12期
关键词
:
D O I
:
10.1049/el:19750188
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:249 / 250
页数:2
相关论文
共 3 条
[1]
GETREU I, 1974, ELECTRONICS 1114, P137
[2]
MEASUREMENT OF EMITTER AND COLLECTOR SERIES RESISTANCES
[J].
GIACOLETTO, LJ
论文数:
0
引用数:
0
h-index:
0
GIACOLETTO, LJ
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
:692
-+
[3]
CHARACTERIZATION AND MEASUREMENT OF BASE AND EMITTER RESISTANCES OF BIPOLAR TRANSISTORS
[J].
SANSEN, WMC
论文数:
0
引用数:
0
h-index:
0
SANSEN, WMC
;
MEYER, RG
论文数:
0
引用数:
0
h-index:
0
MEYER, RG
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1972,
SC 7
(06)
:492
-&
←
1
→
共 3 条
[1]
GETREU I, 1974, ELECTRONICS 1114, P137
[2]
MEASUREMENT OF EMITTER AND COLLECTOR SERIES RESISTANCES
[J].
GIACOLETTO, LJ
论文数:
0
引用数:
0
h-index:
0
GIACOLETTO, LJ
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
:692
-+
[3]
CHARACTERIZATION AND MEASUREMENT OF BASE AND EMITTER RESISTANCES OF BIPOLAR TRANSISTORS
[J].
SANSEN, WMC
论文数:
0
引用数:
0
h-index:
0
SANSEN, WMC
;
MEYER, RG
论文数:
0
引用数:
0
h-index:
0
MEYER, RG
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1972,
SC 7
(06)
:492
-&
←
1
→