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SNAP-BACK - A STABLE REGENERATIVE BREAKDOWN MODE OF MOS DEVICES
被引:22
作者
:
OCHOA, A
论文数:
0
引用数:
0
h-index:
0
机构:
INMOS CORP,COLORADO SPRINGS,CO
INMOS CORP,COLORADO SPRINGS,CO
OCHOA, A
[
1
]
SEXTON, FW
论文数:
0
引用数:
0
h-index:
0
机构:
INMOS CORP,COLORADO SPRINGS,CO
INMOS CORP,COLORADO SPRINGS,CO
SEXTON, FW
[
1
]
WROBEL, TF
论文数:
0
引用数:
0
h-index:
0
机构:
INMOS CORP,COLORADO SPRINGS,CO
INMOS CORP,COLORADO SPRINGS,CO
WROBEL, TF
[
1
]
HASH, GL
论文数:
0
引用数:
0
h-index:
0
机构:
INMOS CORP,COLORADO SPRINGS,CO
INMOS CORP,COLORADO SPRINGS,CO
HASH, GL
[
1
]
SOKEL, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
INMOS CORP,COLORADO SPRINGS,CO
INMOS CORP,COLORADO SPRINGS,CO
SOKEL, RJ
[
1
]
机构
:
[1]
INMOS CORP,COLORADO SPRINGS,CO
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1983年
/ 30卷
/ 06期
关键词
:
D O I
:
10.1109/TNS.1983.4333094
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:4127 / 4130
页数:4
相关论文
共 3 条
[1]
SHORT-CHANNEL MOS-TRANSISTORS IN THE AVALANCHE-MULTIPLICATION REGIME
[J].
MULLER, W
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA TECH UNIV,INST ALLGEMEINE ELEKTROTECH & ELEKTR,A-1040 VIENNA,AUSTRIA
MULLER, W
;
RISCH, L
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA TECH UNIV,INST ALLGEMEINE ELEKTROTECH & ELEKTR,A-1040 VIENNA,AUSTRIA
RISCH, L
;
SCHUTZ, A
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA TECH UNIV,INST ALLGEMEINE ELEKTROTECH & ELEKTR,A-1040 VIENNA,AUSTRIA
SCHUTZ, A
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(11)
:1778
-1784
[2]
SUN E, 1979, BREAKDOWN MECHANISM, P478
[3]
ANALYTICAL MODELS OF THRESHOLD VOLTAGE AND BREAKDOWN VOLTAGE OF SHORT-CHANNEL MOSFETS DERIVED FROM 2-DIMENSIONAL ANALYSIS
[J].
TOYABE, T
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratory, Hitachi, Ltd., Kokubunji
TOYABE, T
;
ASAI, S
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratory, Hitachi, Ltd., Kokubunji
ASAI, S
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
:453
-461
←
1
→
共 3 条
[1]
SHORT-CHANNEL MOS-TRANSISTORS IN THE AVALANCHE-MULTIPLICATION REGIME
[J].
MULLER, W
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA TECH UNIV,INST ALLGEMEINE ELEKTROTECH & ELEKTR,A-1040 VIENNA,AUSTRIA
MULLER, W
;
RISCH, L
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA TECH UNIV,INST ALLGEMEINE ELEKTROTECH & ELEKTR,A-1040 VIENNA,AUSTRIA
RISCH, L
;
SCHUTZ, A
论文数:
0
引用数:
0
h-index:
0
机构:
VIENNA TECH UNIV,INST ALLGEMEINE ELEKTROTECH & ELEKTR,A-1040 VIENNA,AUSTRIA
SCHUTZ, A
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(11)
:1778
-1784
[2]
SUN E, 1979, BREAKDOWN MECHANISM, P478
[3]
ANALYTICAL MODELS OF THRESHOLD VOLTAGE AND BREAKDOWN VOLTAGE OF SHORT-CHANNEL MOSFETS DERIVED FROM 2-DIMENSIONAL ANALYSIS
[J].
TOYABE, T
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratory, Hitachi, Ltd., Kokubunji
TOYABE, T
;
ASAI, S
论文数:
0
引用数:
0
h-index:
0
机构:
Central Research Laboratory, Hitachi, Ltd., Kokubunji
ASAI, S
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
:453
-461
←
1
→