THE ADHESION OF GROWING OXIDE SCALES TO THE SUBSTRATE

被引:12
作者
WOOD, GC [1 ]
STRINGER, J [1 ]
机构
[1] EPRI,DIV GENERAT & STORAGE,PALO ALTO,CA 94303
来源
JOURNAL DE PHYSIQUE IV | 1993年 / 3卷 / C9期
关键词
D O I
10.1051/jp4:1993904
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
There is only limited new understanding of the structure of the evolving dynamic metal/oxide interface itself but there is valuable circumstantial evidence from cooled specimens and from other interfaces. Identification of flaws for crack initiation, definition of a composite defect and elaboration of delamination models, involving a plastically-relaxed crack tip region, have been undertaken. Loss of adhesion has received more attention, by the alternatives of film buckling or crack propagation along the metal/oxide interface by wedging, including cases where stress relief occurs by creep. Mapping of scale failure modes has progressed. Computation and modelling using electronic and atomistic models are useful, but ''clean'' metal/oxide and contaminated interfaces require in-depth work. Stress development and relaxation are complex. Models involve dislocation climb and the role of vacancy transport and cavity development. Sweeping of various particles by moving boundaries is receiving renewed analysis. The role of convoluted metal/oxide interfaces in promoting or diminishing adhesion has been analysed quantitatively. Explanation of reactive element effects by the embedded atom method is instructive, as are the relative roles of S and P in weakening interfacial adhesion.
引用
收藏
页码:65 / 74
页数:10
相关论文
共 34 条
[1]   DOPANT EFFECT OF YTTRIUM AND THE GROWTH AND ADHERENCE OF ALUMINA ON NICKEL-ALUMINUM ALLOYS [J].
ANDERSON, AB ;
MEHANDRU, SP ;
SMIALEK, JL .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (07) :1695-1701
[2]  
[Anonymous], 1959, COMMUNICATION
[3]   DRAGGING OF SMALL OXIDE PARTICLES BY MIGRATING GRAIN BOUNDARIES IN COPPER [J].
ASHBY, MF ;
CENTAMORE, RM .
ACTA METALLURGICA, 1968, 16 (09) :1081-+
[4]  
BENNETT MJ, 1989, AERE R13368
[5]  
CANNON RM, 1985, AM CERAM SOC B, V64, P449
[6]  
COTTRELL AH, 1990, MATER SCI TECH, V6, P326
[7]  
DEARNALEY G, 1990, CORROS SCI, V32, P113
[8]   STRESSES AND DEFORMATION PROCESSES IN THIN-FILMS ON SUBSTRATES [J].
DOERNER, MF ;
NIX, WD .
CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1988, 14 (03) :225-268
[9]   COMPUTER-SIMULATION OF GRAIN-BOUNDARIES IN IONIC-CRYSTALS [J].
DUFFY, DM ;
TASKER, PW .
PHYSICA B & C, 1985, 131 (1-3) :46-52
[10]   EFFECTS OF NON-PLANARITY ON THE MIXED-MODE FRACTURE-RESISTANCE OF BIMATERIAL INTERFACES [J].
EVANS, AG ;
HUTCHINSON, JW .
ACTA METALLURGICA, 1989, 37 (03) :909-916