STRESSES AND DEFORMATION PROCESSES IN THIN-FILMS ON SUBSTRATES

[1] INSITU DETERMINATION OF THE STRUCTURE OF THIN METAL-FILMS BY INTERNAL-STRESS MEASUREMENTS - STRUCTURE DEPENDENCE OF SILVER AND COPPER-FILMS ON OXYGEN-PRESSURE DURING DEPOSITION [J]. THIN SOLID FILMS, 1980, 66 (02) : 217 - 232

[2] STRUCTURE AND INTERNAL-STRESS IN ULTRATHIN SILVER FILMS DEPOSITED ON MGF2 AND SIO SUBSTRATES [J]. THIN SOLID FILMS, 1978, 52 (02) : 215 - 229

[3] INSITU STUDY OF THIN-FILM GROWTH BY INTERNAL-STRESS MEASUREMENT UNDER ULTRAHIGH-VACUUM CONDITIONS - SILVER AND COPPER UNDER THE INFLUENCE OF OXYGEN [J]. THIN SOLID FILMS, 1986, 142 (01) : 65 - 76

[4] INTERNAL-STRESS OF THIN SILVER AND GOLD-FILMS AND ITS DEPENDENCE ON GAS-ADSORPTION [J]. THIN SOLID FILMS, 1979, 62 (02) : 195 - 208

[5] ELECTRON-MICROSCOPE STRUCTURE AND INTERNAL-STRESS IN THIN SILVER AND GOLD-FILMS DEPOSITED ONTO MGF2 AND SIO SUBSTRATES [J]. THIN SOLID FILMS, 1979, 58 (02) : 365 - 370

[6] ALECK BJ, 1949, J APPL MECH-T ASME, V16, P118

[7] EFFECT OF IMPURITIES ON INTRINSIC STRESS IN THIN NI FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01): : 96 - 98

[8] INTERFACE ENERGY AS AN ORIGIN OF INTRINSIC STRESS IN THIN-FILMS [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 70 (02): : K145 - K149

[9] ATKINS AG, 1966, J I MET, V94, P369

[10] BARNETT D, COMMUNICATION

[1] INSITU DETERMINATION OF THE STRUCTURE OF THIN METAL-FILMS BY INTERNAL-STRESS MEASUREMENTS - STRUCTURE DEPENDENCE OF SILVER AND COPPER-FILMS ON OXYGEN-PRESSURE DURING DEPOSITION [J]. THIN SOLID FILMS, 1980, 66 (02) : 217 - 232

[2] STRUCTURE AND INTERNAL-STRESS IN ULTRATHIN SILVER FILMS DEPOSITED ON MGF2 AND SIO SUBSTRATES [J]. THIN SOLID FILMS, 1978, 52 (02) : 215 - 229

[3] INSITU STUDY OF THIN-FILM GROWTH BY INTERNAL-STRESS MEASUREMENT UNDER ULTRAHIGH-VACUUM CONDITIONS - SILVER AND COPPER UNDER THE INFLUENCE OF OXYGEN [J]. THIN SOLID FILMS, 1986, 142 (01) : 65 - 76

[4] INTERNAL-STRESS OF THIN SILVER AND GOLD-FILMS AND ITS DEPENDENCE ON GAS-ADSORPTION [J]. THIN SOLID FILMS, 1979, 62 (02) : 195 - 208

[5] ELECTRON-MICROSCOPE STRUCTURE AND INTERNAL-STRESS IN THIN SILVER AND GOLD-FILMS DEPOSITED ONTO MGF2 AND SIO SUBSTRATES [J]. THIN SOLID FILMS, 1979, 58 (02) : 365 - 370

[6] ALECK BJ, 1949, J APPL MECH-T ASME, V16, P118

[7] EFFECT OF IMPURITIES ON INTRINSIC STRESS IN THIN NI FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01): : 96 - 98

[8] INTERFACE ENERGY AS AN ORIGIN OF INTRINSIC STRESS IN THIN-FILMS [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 70 (02): : K145 - K149

[9] ATKINS AG, 1966, J I MET, V94, P369

[10] BARNETT D, COMMUNICATION