THE STRUCTURE OF NICKEL AND INDIUM OXIDE THIN-FILMS FROM EXAFS DATA

被引:3
作者
BETS, V
ZAMOZDIKS, T
LUSIS, A
PURANS, J
BAUSK, N
SHEROMOV, M
机构
[1] ACAD SCI USSR,INST ORGAN CHEM,NOVOSIBIRSK,USSR
[2] ACAD SCI USSR,INST NUCL PHYS,NOVOSIBIRSK,USSR
关键词
D O I
10.1016/0168-9002(87)90592-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:173 / 174
页数:2
相关论文
共 4 条
[1]   AN EXAFS INVESTIGATION ON THE LATTICE-RELAXATION OF NI-FINE PARTICLES PREPARED BY GAS EVAPORATION [J].
HIDA, M ;
WADA, N ;
MAEDA, H ;
TERAUCHI, H ;
TSU, Y ;
KAMIJO, N .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (01) :L3-L5
[2]  
INCOCCIA L, 1983, SPRINGER SERIES CHEM, V27
[3]  
LUSIS AR, 1985, P INT S SYSTEMS FAST, P197
[4]   REACTIVE MAGNETRON DEPOSITION OF TRANSPARENT CONDUCTIVE FILMS [J].
SMITH, JF ;
ARONSON, AJ ;
CHEN, D ;
CLASS, WH .
THIN SOLID FILMS, 1980, 72 (03) :469-474