NEW MEASUREMENT SYSTEM FOR FAULT LOCATION IN OPTICAL WAVE-GUIDE DEVICES BASED ON AN INTERFEROMETRIC-TECHNIQUE

被引：267

作者：

TAKADA, K

YOKOHAMA, I

CHIDA, K

NODA, J

机构：

来源：

APPLIED OPTICS | 1987年 / 26卷 / 09期

关键词：

D O I：

10.1364/AO.26.001603

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：1603 / 1606

页数：4

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