FIELD-EMISSION CURRENT VOLTAGE CURVES AS A DIAGNOSTIC FOR SCANNING TUNNELING MICROSCOPE TIPS

被引：17

作者：

MEYER, JA

STRANICK, SJ

WANG, JB

WEISS, PS

机构：

[1] Department of Chemistry, Pennsylvania State University, University Park

来源：

ULTRAMICROSCOPY | 1992年 / 42卷

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-3991(92)90479-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The current-voltage (I-V) characteristics of a low-temperature ultrahigh-vacuum scanning tunneling microscope (STM) tip positioned > 100 angstrom from a planar surface have been recorded. We find curvature in the Fowler-Nordheim plots (log10 (I/V2) versus 1/V) due to the tip-plane geometry as has been predicted theoretically. In addition, oscillations and sharp breaks in these I-V curves are observed over a wide voltage range, 50-1000 V. These I-V curves are used to characterize the STM tips prior to tunneling.

引用

页码：1538 / 1541

页数：4

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