X-RAY LINE BROADENING ANALYSIS IN VACUUM-EVAPORATED SILVER FILMS

被引：45

作者：

SEN, S ^{[1
]}

HALDER, SK ^{[1
]}

SENGUPTA, SP ^{[1
]}

机构：

[1] INDIAN ASSOC CULTIVATION SCI,DEPT GEN PHYS & XRAYS,CALCUTTA 700032,INDIA

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1975年 / 38卷 / 06期

关键词：

D O I：

10.1143/JPSJ.38.1641

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1641 / 1647

页数：7

共 26 条

[1] X-RAY LINE BROADENING ANALYSIS OF GOLD FILMS LESS THAN 1000 A THICK [J].

ATASAGUN, M ;

VOOK, RW .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1970, 7 (02) :362-&

[2] INTEGRAL BREADTH ANALYSIS FOR PARTICLE-SIZE AND STRAIN DETERMINATIONS IN COLD-WORKED FCC ALLOYS [J].

CHATTERJEE, SK ;

SENGUPTA, SP .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (03) :609-+

[3]

Chopra K. L., 1969, THIN FILM PHENOMENA

[4] X-RAY DIFFRACTION STUDIES OF COLD-WORKED COPPER-ANTIMONY ALLOYS [J].

DE, M ;

SENGUPTA, SP .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1970, 29 (02) :360-&

[5] STRUCTURE OF ELECTROPLATED AND VAPOR-DEPOSITED COPPER FILMS [J].

GANGULEE, A .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (03) :867-+

[6] STRUCTURE OF ELECTROPLATED AND VAPOR-DEPOSITED COPPER FILMS .2. EFFECTS OF ANNEALING [J].

GANGULEE, A .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) :3943-&

[7] SEPARATION OF PARTICLE SIZE AND LATTICE STRAIN IN INTEGRAL BREADTH MEASUREMENTS [J].

HALDER, NC ;

WAGNER, CNJ .

ACTA CRYSTALLOGRAPHICA, 1966, 20 :312-&

[8]

LAUE MV, 1926, Z KRISTALLOGR, V64, P115

[9] X-RAY LINE BROADENING IN COLD-WORKED MAGNESIUM [J].

LELE, S ;

ANANTHARAMAN, TR .

PHYSICA STATUS SOLIDI, 1964, 5 (03) :K121-K123

[10] X-RAY DIFFRACTION STUDY OF VACUUM-EVAPORATED SILVER FILMS [J].

LIGHT, TB ;

WAGNER, CNJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1966, 3 (01) :1-&

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