HALL-EFFECT MEASUREMENTS ON SHORT-CHANNEL DEVICES USING THE VANDERPAUW DUAL TECHNIQUE

被引：2

作者：

ANDREOU, AG

WESTGATE, CR

机构：

来源：

关键词：

D O I：

10.1109/PROC.1985.13170

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：489 / 490

页数：2

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