X-RAY POLARIMETRY USING THE PHOTOEFFECT IN A CCD DETECTOR

被引：22

作者：

BUSCHHORN, G

KOTTHAUS, R

KUFNER, W

ROSSL, W

RZEPKA, M

SCHMIDT, KH

GENZ, H

GRAF, HD

HOFFMANNSTASCHECK, P

NETHING, U

RICHTER, A

DIX, WR

ILLING, G

LOHMANN, M

PFLUGER, J

REIME, B

SCHILDWACHTER, L

机构：

[1] MAX PLANCK INST PHYS & ASTROPHYS, WERNER HEISENBERG INST, D-80805 MUNICH, GERMANY

[2] TH DARMSTADT, INST KERNPHYS, D-64289 DARMSTADT, GERMANY

[3] DESY, HASYLAB, D-22603 HAMBURG, GERMANY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1994年 / 346卷 / 03期

关键词：

D O I：

10.1016/0168-9002(94)90595-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new method of X-ray polarimetry based on the photoeffect in a finely segmented MOS charge coupled device (CCD) has been applied to monochromatic synchrotron radiation at HASYLAB at DESY and to planar channeling radiation at the superconducting electron linac S-DALINAC at Darmstadt. For the smallest pixel dimensions available today (6.8 X 6.8 mum2) an analyzing power of 10% is observed at an energy of 33 keV. In addition to events from photoeffect in the thin depleted front layer of the CCD also diffusion spread events from much more abundant conversions deeper inside the chip were utilized for polarization analysis.

引用

页码：578 / 588

页数：11

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