HIGH-POWER, PULSED-MICROWAVE MEASUREMENTS OF CRITICAL CURRENTS IN THIN-FILMS OF Y-BA-CU-O AND NB

被引:3
作者
SHIREN, NS
LAIBOWITZ, RB
KAZYAKA, TG
KOCH, RH
机构
[1] IBM Research Division, Yorktown Heights, NY 10598
来源
PHYSICAL REVIEW B | 1991年 / 43卷 / 13期
关键词
D O I
10.1103/PhysRevB.43.10478
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The microwave (16.5-GHz) surface resistance of superconducting Y-Ba-Cu-O and Nb thin films is observed to increase with increasing applied microwave power. At higher powers, Nb films have been driven normal. These effects are attributed to high induced-current densities, approaching the critical values. From these measurements, values for the product lambda-J(c) have been derived, and for Nb we have obtained the temperature dependence of this quantity. By using known values of lambda, the values of J(c) at microwave frequencies have been obtained.
引用
收藏
页码:10478 / 10481
页数:4
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