X-RAY WAVE FIELDS IN PERFECT AND NEARLY PERFECT CRYSTALS - THEORETICAL BACKGROUND AND RECENT APPLICATIONS

被引:7
作者
HILDEBRANDT, G
机构
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1982年 / 15卷 / 11期
关键词
D O I
10.1088/0022-3735/15/11/002
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:1140 / 1155
页数:16
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共 102 条
[1]   ELECTRON-DISTRIBUTION IN SILICON .1. EXPERIMENT [J].
ALDRED, PJE ;
HART, M .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) :223-+
[2]  
[Anonymous], 1976, XRAY DIFFRACTION TOP
[3]   3-DIMENSIONAL X-RAY TOPOGRAPHIC STUDIES OF INTERNAL DISLOCATION SOURCES IN SILICON [J].
AUTHIER, A ;
LANG, AR .
JOURNAL OF APPLIED PHYSICS, 1964, 35 (06) :1956-&
[4]   X-RAY TOPOGRAPHIC DETERMINATION OF INTRINSIC OR EXTRINSIC NATURE OF STACKING-FAULTS [J].
AUTHIER, A ;
PATEL, JR .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 27 (01) :213-222
[5]  
Authier A., 1967, ADVANCES XRAY ANALYS, V10, P9
[6]   Laue spots from perfect, imperfect, and oscillating crystals [J].
Barrett, CS .
PHYSICAL REVIEW, 1931, 38 (04) :832-833
[7]  
BARTH H, 1958, Z NATURFORSCH PT A, V13, P792
[8]   TEST MEASUREMENTS WITH A PERFECT CRYSTAL NEUTRON INTERFEROMETER [J].
BAUSPIESS, W ;
BONSE, U ;
RAUCH, H ;
TREIMER, W .
ZEITSCHRIFT FUR PHYSIK, 1974, 271 (02) :177-182
[9]   SKEW-SYMMETRIC 2-CRYSTAL X-RAY INTERFEROMETER [J].
BECKER, P ;
BONSE, U .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (DEC1) :593-598
[10]   ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL [J].
BECKER, P ;
DORENWENDT, K ;
EBELING, G ;
LAUER, R ;
LUCAS, W ;
PROBST, R ;
RADEMACHER, HJ ;
REIM, G ;
SEYFRIED, P ;
SIEGERT, H .
PHYSICAL REVIEW LETTERS, 1981, 46 (23) :1540-1543