QUANTITATIVE MEASUREMENT OF THE MICROWAVE DISTRIBUTION IN SUPERCONDUCTING TUNNEL-JUNCTIONS

被引：7

作者：

GERBER, R ^{[1
]}

QUENTER, D ^{[1
]}

DODERER, T ^{[1
]}

KRUELLE, CA ^{[1
]}

HUEBENER, RP ^{[1
]}

MULLER, F ^{[1
]}

NIEMEYER, J ^{[1
]}

POPEL, R ^{[1
]}

WEIMANN, T ^{[1
]}

机构：

[1] PHYS TECH BUNDESANSTALT,D-38116 BRAUNSCHWEIG,GERMANY

来源：

APPLIED PHYSICS LETTERS | 1995年 / 66卷 / 12期

关键词：

D O I：

10.1063/1.113644

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Low temperature scanning electron microscopy offers the possibility to measure the microwave distribution inside Josephson tunnel junctions in a quantitative way. The junctions are coupled to an external microwave source. Our results confirm the established model for the propagation of microwaves inside the junction stripline. Our method yields microwave specific parameters of the junction such as wavelength, microwave attenuation, reflection coefficients, and phase shifts.© 1995 American Institute of Physics.

引用

页码：1554 / 1556

页数：3

共 9 条

[1]

DODERER T, 1991, NONLINEAR SUPERCONDUCTIVE ELECTRONICS AND JOSEPHSON DEVICES, P353

[2] rf-induced effects in superconducting tunnel junctions [J].