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A-SCALE DISPLACEMENTS REVEALED BY X-RAY MOIRE TOPOGRAPHS

被引：43
作者：
LANG, AR
MIUSCOV, VF
机构：
来源：
APPLIED PHYSICS LETTERS | 1965年 / 7卷 / 08期
关键词：
D O I：
10.1063/1.1754384
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：214 / &
相关论文
共 8 条
[1]  
BASSETT GA, 1958, P R SOC, VA246, P345
[2]   AN X-RAY INTERFEROMETER [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 6 (08) :155-&
[3]   DYNAMICAL THEORY OF MOIRE FRINGE PATTERNS [J].
GEVERS, R .
PHILOSOPHICAL MAGAZINE, 1962, 7 (82) :1681-&
[4]   DETECTION OF DISLOCATION BY THE MOIRE PATTERN IN ELECTRON MICROGRAPHS [J].
HASHIMOTO, H .
ACTA CRYSTALLOGRAPHICA, 1957, 10 (02) :143-&
[5]   DYNAMICAL THEORY OF ELECTRON DIFFRACTION FOR THE ELECTRON MICROSCOPIC IMAGE OF CRYSTAL LATTICES .1. IMAGES OF SINGLE CRYSTALS [J].
HASHIMOTO, H ;
MANNAMI, M ;
NAIKI, T .
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1961, 253 (1033) :459-&
[6]   A STUDY OF PENDELLOSUNG FRINGES IN X-RAY DIFFRACTION [J].
KATO, N ;
LANG, AR .
ACTA CRYSTALLOGRAPHICA, 1959, 12 (10) :787-&
[7]   THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J].
LANG, AR .
ACTA CRYSTALLOGRAPHICA, 1959, 12 (03) :249-250
[8]   STUDIES OF INDIVIDUAL DISLOCATIONS IN CRYSTALS BY X-RAY DIFFRACTION MICRORADIOGRAPHY [J].
LANG, AR .
JOURNAL OF APPLIED PHYSICS, 1959, 30 (11) :1748-1755
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