EFFECT OF GRAIN-BOUNDARY SCATTERING ON ELECTRICAL-RESISTIVITY OF INDIUM FILMS

被引：34

作者：

PAL, AK ^{[1
]}

CHAUDHURI, S ^{[1
]}

机构：

[1] INDIAN ASSOC CULTIVATION SCI,DEPT GEN PHYS & XRAYS,CALCUTTA 700032,INDIA

来源：

JOURNAL OF MATERIALS SCIENCE | 1976年 / 11卷 / 05期

关键词：

D O I：

10.1007/BF00542304

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：872 / 876

页数：5

共 12 条

[1]

ALEKSANDROV BN, 1963, SOV PHYS JETP-USSR, V16, P286

[2] THE CONDUCTIVITY OF THIN WIRES IN A MAGNETIC FIELD [J].

CHAMBERS, RG .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1950, 202 (1070) :378-394

[3] TEMPERATURE DEPENDENCY OF RESISTANCE OF THIN METAL FILMS [J].

FELDMAN, C .

JOURNAL OF APPLIED PHYSICS, 1963, 34 (06) :1710-&

[4] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[5] ELECTRICAL-RESISTIVITY OF POLYCRYSTALLINE BISMUTH-FILMS [J].

JOGLEKAR, AV ;

KAREKAR, RN ;

SATHIANANDAN, K .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (02) :528-529

[6] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].

MAYADAS, AF ;

SHATZKES, M .

PHYSICAL REVIEW B, 1970, 1 (04) :1382-&

[7] ELECTRICAL RESISTIVITY OF EVAPORATED THIN COBALT FILMS - APPROACH BASED ON MAYADAS-SHATZKES MODEL [J].

MOLA, EE ;

BORRAJO, J ;

HERAS, JM .

SURFACE SCIENCE, 1973, 34 (03) :561-570

[8]

Olsen JL, 1958, HELV PHYS ACTA, V31, P713

[9] SIZE-EFFECT PARAMETERS FOR THIN-FILMS OF ALUMINUM GROUP METALS [J].

REALE, C .

SOLID STATE COMMUNICATIONS, 1973, 12 (06) :421-424

[10] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

ADVANCES IN PHYSICS, 1952, 1 (01) :1-42

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