UV PHOTOEMISSION-STUDY OF LOW-TEMPERATURE OXYGEN-ADSORPTION ON GAAS(110)

被引:36
作者
FRANKEL, DJ
ANDERSON, JR
LAPEYRE, GJ
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1983年 / 1卷 / 03期
关键词
D O I
10.1116/1.582688
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:763 / 766
页数:4
相关论文
共 17 条
  • [1] RECONSTRUCTION AND OXIDATION OF THE GAAS(110) SURFACE
    BARTON, JJ
    GODDARD, WA
    MCGILL, TC
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1178 - 1185
  • [2] OXYGEN INTERACTION WITH GAAS-SURFACES - XPS-UPS STUDY
    BRUNDLE, CR
    SEYBOLD, D
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1186 - 1190
  • [3] OXIDATION OF ORDERED AND DISORDERED GAAS(110)
    CHYE, PW
    SU, CY
    LINDAU, I
    SKEATH, P
    SPICER, WE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1191 - 1194
  • [4] EDQUIST O, 1970, PHYSICA SCRIPTA, V1, P25
  • [5] ADSORPTION OF O-2 AND CO ON CLEAVED GAAS(110) AT LOW-TEMPERATURES
    FRANKEL, DJ
    YUKUN, Y
    AVCI, R
    LAPEYRE, GJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02): : 679 - 683
  • [6] PHOTOEMISSION STUDY OF ADSORPTION OF O2, CO AND H2 ON GAAS(110)
    GREGORY, PE
    SPICER, WE
    [J]. SURFACE SCIENCE, 1976, 54 (02) : 229 - 258
  • [7] VACUUM ULTRAVIOLET RESONANCE LINE RADIATION SOURCE FROM RARE-GAS ATOMS AND IONS FOR UHV PHOTOELECTRON-SPECTROSCOPY
    LANCASTER, GM
    TAYLOR, JA
    IGNATIEV, A
    RABALAIS, JW
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1978, 14 (02) : 143 - 153
  • [8] ELECTRONIC-STRUCTURE OF CLEAVED CLEAN AND OXYGEN-COVERED GAAS (110) SURFACES
    LUTH, H
    BUCHEL, M
    DORN, R
    LIEHR, M
    MATZ, R
    [J]. PHYSICAL REVIEW B, 1977, 15 (02): : 865 - 874
  • [9] THEORY OF OXYGEN-CHEMISORPTION ON GAAS(110)
    MELE, EJ
    JOANNOPOULOS, JD
    [J]. PHYSICAL REVIEW B, 1978, 18 (12): : 6999 - 7010
  • [10] OXIDATION PROPERTIES OF GAAS (110) SURFACES
    PIANETTA, P
    LINDAU, I
    GARNER, CM
    SPICER, WE
    [J]. PHYSICAL REVIEW LETTERS, 1976, 37 (17) : 1166 - 1169