ANALYSIS OF THE INTERACTION OF A LASER-PULSE WITH A SILICON-WAFER - DETERMINATION OF BULK LIFETIME AND SURFACE RECOMBINATION VELOCITY

被引：218

作者：

LUKE, KL ^{[1
]}

CHENG, LJ ^{[1
]}

机构：

[1] CALTECH,JET PROP LAB,PASADENA,CA 91109

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 61卷 / 06期

关键词：

D O I：

10.1063/1.337938

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：2282 / 2293

页数：12

相关论文

共 16 条

[1] SPATIALLY RESOLVED LIFETIME MEASUREMENTS IN NEUTRON-TRANSMUTATION-DOPED POLYCRYSTALLINE SILICON
DAMASKINOS, S
DIXON, AE
ROBERTS, GD
DAGG, IR
[J]. JOURNAL OF APPLIED PHYSICS, 1986, 60 (05) : 1681 - 1688
[2] MEASUREMENT OF LIFETIME OF CARRIERS IN SEMICONDUCTORS THROUGH MICROWAVE REFLECTION
DEB, S
NAG, BR
[J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (04) : 1604 - &
[3] VOLUME AND SURFACE RECOMBINATION RATES FOR INJECTED CARRIERS IN GERMANIUM
MCKELVEY, JP
LONGINI, RL
[J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (05) : 634 - 641
[4] MCKELVEY JP, 1982, SOLID STATE SEMICOND, P354
[5] SOLUTION OF THE CONTINUITY EQUATION IN PLANAR SYMMETRY CASES AND ASSESSMENT OF PHOTOLUMINESCENCE DECAY
MISIAKOS, K
LINDHOLM, FA
NEUGROSCHEL, A
[J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (04) : 1647 - 1650
[6] MOKASHI AR, 1985, DOEJPL1012107 JET PR
[7] MOKASHI AR, 1985, DOEJPL1012108 JET PR
[8] PRINCE MB, 1985, DOEJPL1012103 JET PR, P3
[9] MEASUREMENT OF DIFFUSION LENGTH IN SOLAR CELLS
REYNOLDS, JH
MEULENBERG, A
[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (06) : 2582 - 2592
[10] SHOCKLEY W, 1950, ELECT HOLES SEMICOND, P319