SPATIALLY RESOLVED LIFETIME MEASUREMENTS IN NEUTRON-TRANSMUTATION-DOPED POLYCRYSTALLINE SILICON

[1] MICROWAVE MEASUREMENT OF SEMICONDUCTOR CARRIER LIFETIMES [J]. JOURNAL OF APPLIED PHYSICS, 1960, 31 (05) : 938 - 939

[2] BREANT P, 1981, NEUTRON TRANSMUTATIO, P287

[3] CLAIRON PJ, 1979, NEUTRON TRANSMUTATIO, P291

[4] CRICK NW, 1981, NEUTRON TRANSMUTATIO, P211

[5] SCANNING-LASER-MICROSCOPE MEASUREMENTS OF MINORITY-CARRIER DIFFUSION LENGTH AND SURFACE RECOMBINATION VELOCITY IN POLYCRYSTALLINE SILICON [J]. CANADIAN JOURNAL OF PHYSICS, 1985, 63 (06) : 870 - 875

[6] DAMASKINOS S, 1985, THESIS U WATERLOO

[7] MEASUREMENT OF LIFETIME OF CARRIERS IN SEMICONDUCTORS THROUGH MICROWAVE REFLECTION [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (04) : 1604 - &

[8] HO VQ, 1981, NEUTRON TRANSMUTATIO, P151

[9] Katz L., 1979, Neutron Transmutation Doping in Semiconductors, P307

[10] LARRABEE RD, 1960, RCA REV, V21, P124

[1] MICROWAVE MEASUREMENT OF SEMICONDUCTOR CARRIER LIFETIMES [J]. JOURNAL OF APPLIED PHYSICS, 1960, 31 (05) : 938 - 939

[2] BREANT P, 1981, NEUTRON TRANSMUTATIO, P287

[3] CLAIRON PJ, 1979, NEUTRON TRANSMUTATIO, P291

[4] CRICK NW, 1981, NEUTRON TRANSMUTATIO, P211

[5] SCANNING-LASER-MICROSCOPE MEASUREMENTS OF MINORITY-CARRIER DIFFUSION LENGTH AND SURFACE RECOMBINATION VELOCITY IN POLYCRYSTALLINE SILICON [J]. CANADIAN JOURNAL OF PHYSICS, 1985, 63 (06) : 870 - 875

[6] DAMASKINOS S, 1985, THESIS U WATERLOO

[7] MEASUREMENT OF LIFETIME OF CARRIERS IN SEMICONDUCTORS THROUGH MICROWAVE REFLECTION [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (04) : 1604 - &

[8] HO VQ, 1981, NEUTRON TRANSMUTATIO, P151

[9] Katz L., 1979, Neutron Transmutation Doping in Semiconductors, P307

[10] LARRABEE RD, 1960, RCA REV, V21, P124