A CHARACTERIZATION OF SPARK-PRODUCED AEROSOLS BY AUTOMATED ELECTRON-PROBE MICRO-ANALYSIS

被引:21
作者
RAEYMAEKERS, B
VANESPEN, P
ADAMS, F
BROEKAERT, JAC
机构
[1] UNIV INSTELLING ANTWERP,DEPT CHEM,UNIV PLEIN 1,B-2610 WILRIJK,BELGIUM
[2] INST SPEKTROCHEM & ANGEW SPEKT,D-4600 DORTMUND 1,FED REP GER
关键词
D O I
10.1366/0003702884428789
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
16
引用
收藏
页码:142 / 150
页数:9
相关论文
共 16 条
[1]  
ARMSTRONG J, 1985, XRAY SPECTROMETRY, V14, P180
[2]   A STUDY OF DIRECT ANALYSIS OF SOLID SAMPLES USING SPARK ABLATION COMBINED WITH EXCITATION IN AN INDUCTIVELY COUPLED PLASMA [J].
AZIZ, A ;
BROEKAERT, JAC ;
LAQUA, K ;
LEIS, F .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1984, 39 (9-11) :1091-1103
[3]   COMPUTER-SIMULATION OF RF INDUCTION-HEATED ARGON PLASMA DISCHARGES AT ATMOSPHERIC-PRESSURE FOR SPECTROCHEMICAL ANALYSIS .1. PRELIMINARY INVESTIGATIONS [J].
BARNES, RM ;
SCHLEICHER, RG .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1975, B 30 (04) :109-134
[4]  
BROEKAERT JAC, 1985, INSTRUMENTELLE MULTI, P359
[5]   FLUORESCENCE YIELDS, OMEGA-K (12-LESS-THAN-OR-EQUAL-TO-Z-LESS-THAN-OR-EQUAL-TO-42) AND OMEGA-L3 (38-LESS-THAN-OR-EQUAL-TO-Z-LESS-THAN-OR-EQUAL-TO-79), FROM A COMPARISON OF LITERATURE AND EXPERIMENTS (SEM) [J].
HANKE, W ;
WERNISCH, J ;
POHN, C .
X-RAY SPECTROMETRY, 1985, 14 (01) :43-47
[6]   MICROSCOPIC INVESTIGATIONS OF THE MATERIAL ERODED BY A HIGH-VOLTAGE SPARK DISCHARGE [J].
HELMER, DJC ;
WALTERS, JP .
APPLIED SPECTROSCOPY, 1984, 38 (03) :399-405
[7]   ANALYSIS OF THE EFFLUENT FROM A HIGH-VOLTAGE SPARK DISCHARGE WITH A MICROWAVE-INDUCED PLASMA [J].
HELMER, DJC ;
WALTERS, JP .
APPLIED SPECTROSCOPY, 1984, 38 (03) :392-398
[8]   USE OF A SPARK AS A SAMPLING - NEBULIZING DEVICE FOR SOLID SAMPLES IN ATOMIC-ABSORPTION, ATOMIC-FLUORESCENCE AND INDUCTIVELY COUPLED PLASMA EMISSION SPECTROMETRY [J].
HUMAN, HGC ;
SCOTT, RH ;
OAKES, AR ;
WEST, CD .
ANALYST, 1976, 101 (1201) :265-271
[9]   VERSATILE ATOMIC NUMBER CORRECTION FOR ELECTRON-PROBE MICROANALYSIS [J].
LOVE, G ;
COX, MG ;
SCOTT, VD .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1978, 11 (01) :7-21
[10]   ATOMIC-NUMBER CORRECTION IN ELECTRON-PROBE X-RAY-MICROANALYSIS OF CURVED SAMPLES AND PARTICLES [J].
MARKOWICZ, AA ;
VANGRIEKEN, RE .
ANALYTICAL CHEMISTRY, 1984, 56 (14) :2798-2801