VERSATILE ATOMIC NUMBER CORRECTION FOR ELECTRON-PROBE MICROANALYSIS

[1] BEAMAN DR, 1972, ASTM506 SPEC TECH PU

[2] Bethe, 1953, EXPT NUCL PHYS, V1, P252

[3] Bethe H, 1930, ANN PHYS-BERLIN, V5, P325

[4] PROSPECTS FOR AN IMPROVED ABSORPTION CORRECTION IN ELECTRON-PROBE MICROANALYSIS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (14) : 2009 - 2020

[5] ABSORPTION AND ATOMIC NUMBER CORRECTIONS IN ELECTRON-PROBE X-RAY MICROANALYSIS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (06) : 673 - &

[6] BISHOP HE, 1966, XRAY OPTICS MICROANA, P153

[7] X-RAY PRODUCTION AS A FUNCTION OF DEPTH FOR LOW ELECTRON ENERGIES [J]. X-RAY SPECTROMETRY, 1976, 5 (01) : 36 - 40

[8] Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]

[9] COLBY JW, 1966, ELECTRON MICROPROBE, P95

[10] CURGENVEN L, 1971, 303 TUB INV RES REP

[1] BEAMAN DR, 1972, ASTM506 SPEC TECH PU

[2] Bethe, 1953, EXPT NUCL PHYS, V1, P252

[3] Bethe H, 1930, ANN PHYS-BERLIN, V5, P325

[4] PROSPECTS FOR AN IMPROVED ABSORPTION CORRECTION IN ELECTRON-PROBE MICROANALYSIS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (14) : 2009 - 2020

[5] ABSORPTION AND ATOMIC NUMBER CORRECTIONS IN ELECTRON-PROBE X-RAY MICROANALYSIS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (06) : 673 - &

[6] BISHOP HE, 1966, XRAY OPTICS MICROANA, P153

[7] X-RAY PRODUCTION AS A FUNCTION OF DEPTH FOR LOW ELECTRON ENERGIES [J]. X-RAY SPECTROMETRY, 1976, 5 (01) : 36 - 40

[8] Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]

[9] COLBY JW, 1966, ELECTRON MICROPROBE, P95

[10] CURGENVEN L, 1971, 303 TUB INV RES REP