PROSPECTS FOR AN IMPROVED ABSORPTION CORRECTION IN ELECTRON-PROBE MICROANALYSIS

被引:65
作者
BISHOP, HE [1 ]
机构
[1] ATOM ENERGY RES ESTAB, MAT DEV DIV, DIDCOT, BERKSHIRE, ENGLAND
关键词
D O I
10.1088/0022-3727/7/14/320
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2009 / 2020
页数:12
相关论文
共 20 条
[1]   AN EVALUATION OF ABSORPTION CORRECTION FUNCTIONS FOR ELECTRON PROBE MICROANALYSIS [J].
ANDERSEN, CA ;
WITTRY, DB .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (05) :529-&
[2]   ELECTRON SCATTERING IN THICK TARGETS [J].
BISHOP, HE .
BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (06) :703-&
[3]   SIMPLE METHOD OF THIN-FILM ANALYSIS IN ELECTRON-PROBE MICROANALYZER [J].
BISHOP, HE ;
POOLE, DM .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (09) :1142-1158
[4]   AN ELECTRON TRANSPORT MODEL FOR PREDICTION OF X-RAY PRODUCTION AND ELECTRON BACKSCATTERING IN ELECTRON MICROANALYSIS [J].
BROWN, DB ;
OGILVIE, RE .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (12) :4429-&
[5]  
BROWN JD, 1972, XRAY OPTICS MICROANA, P163
[6]  
CASTAING R, 1954, CR HEBD ACAD SCI, V238, P1506
[7]   MULTIPLE SCATTERING OF 5-30 KEV ELECTRONS IN EVAPORATED METAL FILMS .2. RANGE-ENERGY RELATIONS [J].
COSSLETT, VE ;
THOMAS, RN .
BRITISH JOURNAL OF APPLIED PHYSICS, 1964, 15 (11) :1283-&
[8]  
Duncumb P., 1968, Quantitative electron probe microanalysis, NBS Special Publication 298, P133
[9]  
DUNCUMB P, 1969, XRAY OPTICS MICROANA, P146
[10]  
DUNCUMB P, 1966, XRAY OPTICS MICROANA, P240