EVALUATION OF THE SCALING EXPONENT OF SELF-AFFINE FRACTAL SURFACE FROM A SINGLE SCANNING PROBE MICROSCOPE IMAGE

被引：33

作者：

RAO, MVH

MATHUR, BK

CHOPRA, KL

机构：

[1] Department of Physics and Meteorology, Indian Institute of Technology, Kharagpur, West Bengal

来源：

APPLIED PHYSICS LETTERS | 1994年 / 65卷 / 01期

关键词：

D O I：

10.1063/1.113055

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A direct method of evaluating the scaling exponent H of a self-affine fractal surface from a single topographic image recorded by using scanning probe microscopy is presented. This method uses the fact that for these surfaces the Toot-mean-square roughness increases with length as L(H). The method is applied to study the fractal nature of silver films of different thicknesses and it is observed that the variation in the scaling exponent H is in correlation with the surface roughness and the observed growth mode.

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页码：124 / 126

页数：3

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