STATISTICAL-MODEL FOR STEP AND RAMP VOLTAGE BREAKDOWN TESTS IN THIN INSULATORS

被引：39

作者：

SOLOMON, P ^{[1
]}

KLEIN, N ^{[1
]}

ALBERT, M ^{[1
]}

机构：

[1] TECHNION ISRAEL INST TECHNOL,FAC ELECT ENGN,HAIFA,ISRAEL

来源：

THIN SOLID FILMS | 1976年 / 35卷 / 03期

关键词：

D O I：

10.1016/0040-6090(76)90198-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：321 / 326

页数：6

共 10 条

[1]

ABROMOWITZ M, 1965, HDB MATHEMATICAL FUN, P930

[2]

ALBERT N, 1972, THIN SOLID FILMS, V13, P221

[3] STATISTICAL NATURE OF BREAKDOWN SEQUENCES IN A LIQUID INSULANT [J].

BRIGNELL, JE .

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1966, 113 (10) :1683-&

[4] DIELECTRIC-BREAKDOWN OF ANODIC ALUMINUM-OXIDE [J].

DEWIT, HJ ;

CREVECOEUR, C .

PHYSICS LETTERS A, 1974, A 50 (05) :365-366

[5]

DEWIT HJ, 1975, MAY TOR M EL SOC

[6] THEORY OF LOCALIZED ELECTRONIC BREAKDOWN IN INSULATING FILMS [J].

KLEIN, N .

ADVANCES IN PHYSICS, 1972, 21 (92) :605-+

[7]

KLEIN N, 1969, ADVAN ELECTRON ELECT, V26, P309

[8] STATISTICAL INTERPRETATION OF ELECTRICAL BREAKDOWN OF LIQUID DIELECTRICS [J].

LEWIS, TJ ;

WARD, BW .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1962, 269 (1337) :233-+

[9]

SOLOMON P, 1974, THESIS HAIFA

[10] THIN-FILM BREAKDOWN COUNTER OF FISSION FRAGMENTS [J].

TOMMASINO, L ;

KLEIN, N ;

SOLOMON, P .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (04) :1484-1488

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