SUBMICRON TRANSDUCER SPACINGS IN ROTATING HEAD-TAPE INTERFACES

被引:5
作者
TALKE, FE [1 ]
TSENG, RC [1 ]
机构
[1] IBM CORP,SAN JOSE,CA 95114
关键词
D O I
10.1109/TMAG.1976.1059234
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:725 / 727
页数:3
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HARRIS JP, 1975, P IEEE, V63
[3]   APPLICATION OF WHITE-LIGHT INTERFEROMETRY IN THIN-FILM MEASUREMENTS [J].
LIN, C ;
SULLIVAN, RF .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1972, 16 (03) :269-&
[4]  
WILDMAN M, 1975, P IEEE, V63