ATOMIC MIXING IN ION PROBE MICROANALYSIS

[1] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[2] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[3] ANALYSIS OF THIN FILMS BY ION MICROPROBE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1970, 42 (09) : 1060 - &

[4] ISHITANI T, 1975, APPL PHYS, V6, P241, DOI 10.1007/BF00883758

[5] Kelly R., 1973, Radiation Effects, V19, P39, DOI 10.1080/00337577308232213

[6] TAMURA H, 1972, 6TH P INT C XRAY OPT, P423

[7] TAMURA H, 1973, 21 AM SOC MASS SPECT

[8] TAMURA H, 1968, ADV MASS SPECTROMETR, V5, P441

[9] INVESTIGATION OF SURFACE-LAYERS BY SIMS AND SIIMS [J]. SURFACE SCIENCE, 1973, 35 (01) : 458 - 472

[10] THE DETERMINATION OF THE THICKNESS, DIELECTRIC CONSTANT, AND OTHER PROPERTIES OF ANODIC OXIDE FILMS ON TANTALUM FROM THE INTERFERENCE COLOURS [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1958, 244 (1236): : 41 - 53

[1] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457

[2] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[3] ANALYSIS OF THIN FILMS BY ION MICROPROBE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1970, 42 (09) : 1060 - &

[4] ISHITANI T, 1975, APPL PHYS, V6, P241, DOI 10.1007/BF00883758

[5] Kelly R., 1973, Radiation Effects, V19, P39, DOI 10.1080/00337577308232213

[6] TAMURA H, 1972, 6TH P INT C XRAY OPT, P423

[7] TAMURA H, 1973, 21 AM SOC MASS SPECT

[8] TAMURA H, 1968, ADV MASS SPECTROMETR, V5, P441

[9] INVESTIGATION OF SURFACE-LAYERS BY SIMS AND SIIMS [J]. SURFACE SCIENCE, 1973, 35 (01) : 458 - 472

[10] THE DETERMINATION OF THE THICKNESS, DIELECTRIC CONSTANT, AND OTHER PROPERTIES OF ANODIC OXIDE FILMS ON TANTALUM FROM THE INTERFERENCE COLOURS [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1958, 244 (1236): : 41 - 53