VALENCE ELECTRONIC-STRUCTURE OF POLYCRYSTALLINE SIC AS OBSERVED BY (E, 2E) SPECTROSCOPY

被引:16
作者
CAI, YQ
VOS, M
STORER, P
KHEIFETS, AS
MCCARTHY, IE
WEIGOLD, E
机构
[1] Electronic Structure of Materials Centre, Flinders University of South Australia, Adelaide, SA 5001
来源
PHYSICAL REVIEW B | 1995年 / 51卷 / 06期
关键词
D O I
10.1103/PhysRevB.51.3449
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The spectral momentum density ρ(ε,q) of the valence electrons of a thin polycrystalline silicon carbide (SiC) film has been measured using an (e,2e) spectrometer employing a noncoplanar asymmetric geometry with estimated energy and momentum resolutions of about 2.0 eV and 0.15 a.u., respectively. Well-defined valence-band dispersion has been observed from the measured momentum density which resembles a parabola, but deviates from what is expected for a free electron near the top of the band and at the boundary of the Brillouin zone, where the antisymmetric gap due to the unequal potentials between the Si and C sites in SiC is clearly visible. Based on the assumption that the spectral momentum density of polycrystalline materials is a spherical average of the spectral momentum density of the corresponding single crystalline phase of the materials, ab initio linear muffin-tin orbital calculations have been performed using the zinc-blende structure of β-SiC. The measured dispersion of the energy band is in excellent agreement with theory. Reasonable agreement is also obtained for the energy-integrated momentum density, although the measured momentum density exceeds considerably the calculated one at high momenta. The theoretical implication of using crystal band-structure calculations for studying disordered materials is also discussed. © 1995 The American Physical Society.
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收藏
页码:3449 / 3457
页数:9
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