ODMR INVESTIGATION OF RECOMBINATION IN MU-C-SI-H

被引：7

作者：

DEPINNA, SP

HOMEWOOD, K

CAVENETT, BC

AUSTIN, IG

SEARLE, TM

WILLEKE, G

KINMOND, S

机构：

[1] UNIV HULL,DEPT PHYS,HULL HU6 7RX,N HUMBERSIDE,ENGLAND

[2] UNIV SHEFFIELD,DEPT PHYS,SHEFFIELD S10 2TN,S YORKSHIRE,ENGLAND

[3] UNIV DUNDEE,DEPT PHYS,DUNDEE DD1 4HN,SCOTLAND

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1983年 / 47卷 / 05期

关键词：

D O I：

10.1080/13642812.1983.11643266

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：L57 / L62

页数：6

共 13 条

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[4]

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[5]

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[6] CHARACTERIZATION OF RADIATIVE RECOMBINATION IN AMORPHOUS-SILICON BY OPTICALLY DETECTED MAGNETIC-RESONANCE .2. [J].

DEPINNA, S ;

CAVENETT, BC ;

SEARLE, TM ;

AUSTIN, IG .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1982, 46 (05) :501-513

[7] CHARACTERIZATION OF RADIATIVE RECOMBINATION IN AMORPHOUS-SILICON BY OPTICALLY DETECTED MAGNETIC-RESONANCE .1. [J].

DEPINNA, S ;

CAVENETT, BC ;

AUSTIN, IG ;

SEARLE, TM ;

THOMPSON, MJ ;

ALLISON, J ;

LECOMBER, PG .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1982, 46 (05) :473-500

[8]

HASEGAWA S, 1983, PHYSICA B, V117

[9] OPTICAL-DETECTION OF MAGNETIC-RESONANCE FOR A DEEP-LEVEL DEFECT IN SILICON [J].

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ODONNELL, KP ;

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WATKINS, GD .

PHYSICAL REVIEW LETTERS, 1982, 48 (01) :37-40

[10]

ODONNELL KP, 1983, 1982 P INT DEF C AMS

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