X-RAY CRYSTALLOGRAPHIC STUDIES OF PB MONOLAYERS ON CU(110) SURFACES

[1] THE EPITAXIAL-GROWTH OF THALLIUM ON COPPER (100) - A STUDY BY LEED, AES, UPS AND EELS [J]. SURFACE SCIENCE, 1982, 115 (02) : 395 - 416

[2] Brennan S., 1985, Structure of Surfaces, P421

[3] A NOVEL X-RAY-SCATTERING DIFFRACTOMETER FOR STUDYING SURFACE-STRUCTURES UNDER UHV CONDITIONS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 222 (1-2) : 164 - 167

[4] CRITICAL SURFACE SCATTERING OF X-RAYS AND NEUTRONS AT GRAZING ANGLES [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (16) : 1469 - 1471

[5] SIGNIFICANCE TESTS ON CRYSTALLOGRAPHIC R FACTOR [J]. ACTA CRYSTALLOGRAPHICA, 1965, 18 : 502 - &

[6] LEED STUDIES OF FIRST STAGES OF DEPOSITION AND MELTING OF LEAD ON LOW INDEX FACES OF COPPER [J]. SURFACE SCIENCE, 1972, 29 (01) : 20 - &

[7] Ibers J. A., 1974, International Tables for X-ray Crystallography, VIV

[8] James R.W., 1982, OPTICAL PRINCIPLES D

[9] X-RAY-DIFFRACTION STUDIES - MELTING OF PB MONOLAYERS ON CU(110) SURFACES [J]. PHYSICAL REVIEW LETTERS, 1982, 49 (16) : 1169 - 1172

[10] MARRA WC, 1981, THESIS STEVENS I TEC

[1] THE EPITAXIAL-GROWTH OF THALLIUM ON COPPER (100) - A STUDY BY LEED, AES, UPS AND EELS [J]. SURFACE SCIENCE, 1982, 115 (02) : 395 - 416

[2] Brennan S., 1985, Structure of Surfaces, P421

[3] A NOVEL X-RAY-SCATTERING DIFFRACTOMETER FOR STUDYING SURFACE-STRUCTURES UNDER UHV CONDITIONS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 222 (1-2) : 164 - 167

[4] CRITICAL SURFACE SCATTERING OF X-RAYS AND NEUTRONS AT GRAZING ANGLES [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (16) : 1469 - 1471

[5] SIGNIFICANCE TESTS ON CRYSTALLOGRAPHIC R FACTOR [J]. ACTA CRYSTALLOGRAPHICA, 1965, 18 : 502 - &

[6] LEED STUDIES OF FIRST STAGES OF DEPOSITION AND MELTING OF LEAD ON LOW INDEX FACES OF COPPER [J]. SURFACE SCIENCE, 1972, 29 (01) : 20 - &

[7] Ibers J. A., 1974, International Tables for X-ray Crystallography, VIV

[8] James R.W., 1982, OPTICAL PRINCIPLES D

[9] X-RAY-DIFFRACTION STUDIES - MELTING OF PB MONOLAYERS ON CU(110) SURFACES [J]. PHYSICAL REVIEW LETTERS, 1982, 49 (16) : 1169 - 1172

[10] MARRA WC, 1981, THESIS STEVENS I TEC