RADIATION HARDNESS AND ANNEALING TESTS OF A CUSTOM VLSI DEVICE

被引:7
作者
BREAKSTONE, A
PARKER, S
ADOLPHSEN, C
LITKE, A
SCHWARZ, A
TURALA, M
LUTH, V
机构
[1] UNIV CALIF SANTA CRUZ,SANTA CRUZ INST PARTICLE PHYS,SANTA CRUZ,CA 95064
[2] STANFORD UNIV,STANFORD LINEAR ACCELERATOR CTR,STANFORD,CA 94305
关键词
D O I
10.1109/TNS.1987.4337391
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:491 / 494
页数:4
相关论文
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