THIN CARBON FOILS FOR THE ELIMINATION OF CHARGING EFFECTS IN PROTON-INDUCED X-RAY-EMISSION SPECTROMETRY

被引：6

作者：

OONA, H

KIRCHNER, SJ

KRESAN, PL

FERNANDO, Q

机构：

[1] UNIV ARIZONA,DEPT CHEM,TUCSON,AZ 85721

[2] UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822

来源：

ANALYTICAL CHEMISTRY | 1979年 / 51卷 / 02期

关键词：

D O I：

10.1021/ac50038a037

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：302 / 303

页数：2

共 7 条

[1] ELIMINATION OF CHARGING IN PROTON-INDUCED X-RAY-EMISSION ANALYSIS OF INSULATING SAMPLES [J].

AHLBERG, M ;

JOHANSSON, G ;

MALMQVIST, K .

NUCLEAR INSTRUMENTS & METHODS, 1975, 131 (02) :377-379

[2] PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS [J].

FOLKMANN, F ;

GAARDE, C ;

HUUS, T ;

KEMP, K .

NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03) :487-499

[3] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J].

JOHANSSON, TB ;

AKSELSSON, R ;

JOHANSSON, SA .

NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01) :141-+

[4]

JOPSON RC, 1963, PHYS REV, V127, P1613

[5]

MACDONALD GL, 1978, ANAL CHEM, V50, pR135, DOI 10.1021/ac50028a016

[6] DETERMINATION OF FLUORIDE CONCENTRATION PROFILE IN TOOTH ENAMEL USING A NUCLEAR-RESONANCE TECHNIQUE [J].

MANDLER, JW ;

MOLER, RB ;

RAISEN, E ;

RAJAN, KS .

THIN SOLID FILMS, 1973, 19 (01) :165-172

[7]

OONA H, UNPUBLISHED

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