MODELING GAAS HIGH-VOLTAGE, SUBNANOSECOND PHOTOCONDUCTIVE SWITCHES IN ONE SPATIAL DIMENSION

被引:32
作者
WHITE, WT
DEASE, CG
POCHA, MD
KHANAKA, GH
机构
[1] Lawrence Livermore National Laboratory, Livermore, CA, 94550, P.O. Box 808
关键词
D O I
10.1109/16.64530
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thick uniform slabs of semi-insulating gallium arsenide show an avalanche-like rise in photocurrent when subjected to electric field intensities of tens of kilovolts per centimeter (spatially averaged). We discuss two possible mechanisms for such switching: field-compression-induced ionization of valence states and field-dependent trapping of charge carriers. Analysis and computations suggest that field compression is limited to roughly a factor of two at low initial fields. This shows that one cannot achieve arbitrary amounts of field enhancement and so obtain avalanche-like performance at will. At initial field strengths of 10 to 50 kV/cm, Gunn instabilities produce large field compression, but carrier trapping and recombination quench intrinsic photoavalanching, according to our calculations. Observed “avalanching” may therefore be due to extrinsic effects related to deep levels. As an alternative to intrinsic impact ionization, we show that field-dependent trap filling can yield an avalanche-like rise in current and may account for two other experimental observations, the existence of a voltage threshold and a voltage-dependent delay between the start of illumination and the occurrence of switching. © 1990 IEEE
引用
收藏
页码:2532 / 2541
页数:10
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