SURFACE ANALYSIS BY ARGON ION INDUCED X-RAY-FLUORESCENCE

被引：12

作者：

HEITZ, C ^{[1
]}

KWADOW, M ^{[1
]}

TENORIO, D ^{[1
]}

机构：

[1] UNIV LOUIS PASTEUR,STRASBOURG,FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS | 1978年 / 149卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(78)90912-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In heavy ion-atom collisions electron promotion via quasimolecular orbitals enhances the ionization of the target atoms having electronic levels slightly higher than those of the projectile. Ar ions induce the X-ray emission of elements with K, L or M shell energies below 3.2 keV. The application of this phenomenon to surface analysis with Ar+ and Ar++ ions, accelerated up to 3 MV is discussed. © 1978.

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收藏

页码：483 / 488

页数：6

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